Potentiometric-Scanning Ion Conductance Microscopy (P-SICM) is a rising sub-class of scanning ion conductance microscopy (SICM) that allows for the simultaneous collection of topography and local apparent conductance. In the Bakergrp, this technique began with past group members such as, Chiao-Chen who started by making single-point measurements (Chen, C. C.; Zhou, Y.; Morris, C. A.; Hou,…
Our research group aims to train students to excel as both a scientist and a person. We realize and value the importance of diverse backgrounds and ideas in generating new scientific knowledge, and in promoting a healthy work environment. We value freedom of expression, civil discourse, and diversity in opinions, research, teaching, and life.